Compact Surface Profiling Device is used in a wide range of applications and industries, from R&D departments and universities to production and process monitoring. The Surface Profiling Device is provided with precise force control which provides excellent vertical resolution, precision, and reliability measurements. The Surface Profiling Device delivers automated step height, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials. Compact Surface Profiling Device is made of using quality grade raw material which ensures optimum durability along with long lasting trouble free service.
